Semiconductor Engineering

Scalable End-To-End Test Solutions For Today’s Complex SoCs

Left-shifting DFT, scalable tests from manufacturing to the field, enabling system-level tests for in-field debug.
Semiconductor Engineering

Building Bridges: A New DFT Paradigm

Over the last twenty years, structural testing with scan chains has become pervasive in chip design methodology. Indeed, it’s remarkable to think that most electronic devices we interact with today ...
Electronic Design

How to Succeed With Structural Test

The decision to change from a functional to a structural test methodology is a far-reaching one. Functional test vectors are meant to check for correct device functionality. Structural test vectors ...
EDN

Start-Ups See DFT As Springboard To Enter Market

BALTIMORE—There are start-ups here at the 32nd International Test Conference that plan to take advantage of the call for low-cost structural automated test equipment (ATE) and usurp market share from ...
Electronic Design

Design-For-Test The Smart Way: dFT With A "Big T" And A "Little d"

Design-for-test, or DFT, should facilitate high-quality test, not change the design. Test techniques and strategies need to supply a high-quality test that screens out defective devices, avoiding ...
EDN

DFT Stirring UP ATE at ITC

BALTIMORE — Design-for-test (DFT) is no longer just a subject for debate and International Test Conference (ITC) papers as the automated test equipment (ATE) industry begins to respond with more than ...