As integrated circuits become more complex and costly to manufacture, it is crucial to incorporate testability features early in the design process. Design for Testability (DFT) techniques enhance ...
A new technical paper titled “CROP: Circuit Retrieval and Optimization with Parameter Guidance using LLMs” was published by researchers at Duke University and Synopsys. “Modern very large-scale ...
SEOUL, South Korea, June 9, 2025 /PRNewswire/ -- SK hynix Inc. (or "the company", www.skhynix.com) announced today that it presented a new DRAM technology roadmap for the next 30 years and the ...
The dispute over patented semiconductor technology has seen several dramatic turns during its history. An appellate court in 2023 reversed a Texas jury's $2.1 billion verdict against Intel. The Texas ...
The semiconductor industry continues to face numerous challenges as designs approach reticle limits, process nodes evolve and engineering resources become increasingly stretched. It is essential to ...
UPDATE: In a newly revealed addition to the collaboration, Maserati and Giorgetti have also unveiled a bespoke one-off vehicle: the Grecale Giorgetti Edition. Built as part of Maserati’s Fuoriserie ...
Abstract: In this paper, a complete analysis for the input combinations of balanced and unbalanced adder trees based on C-testability conditions is presented. Based on the analysis, a simple and ...
Design for testability (DFT) embeds testable features into an integrated circuit (IC) during design, while silicon bring-up initiates chip evaluation and debugging. Streamlining these sequential ...
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