Using AI and machine learning as transformative solutions for semiconductor device modeling and parameter extraction.
Abstract: This work systematically investigates the low-frequency noise (LFN) characteristics of polycrystalline silicon (poly-Si) thin-film transistors (TFTs) under hot-carrier (HC) stress. Notably, ...
This project demonstrates how to perform full-parameter fine-tuning on the Qwen3 0.6B model for a Chinese sentiment analysis task using MLX-LM. qwen3_sentiment_finetune/ ├── README.md # This file ├── ...
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